5 search results - page 1 / 1 » Characteristic faults and spectral information for logic BIS... |
ICCAD
2002
IEEE
14 years 1 months ago
2002
IEEE
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspecific spectral information in th...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a logic synthesis tool called BETSY (BIST Environment Testable Synthesis) for synthesizing circuits that achieve complete (100%)fault coverage in a user specif...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
ECIS
2003
13 years 6 months ago
2003
Since networks and computing systems are vital components of today's life, it is of utmost importance to endow them with the capability to survive physical and logical faults...
HPCA
2008
IEEE
14 years 5 months ago
2008
IEEE
Interconnection networks-on-chip (NOCs) are rapidly replacing other forms of interconnect in chip multiprocessors and system-on-chip designs. Existing interconnection networks use...