3 search results - page 1 / 1 » Characterization of the errors of the FMM in particle simula... |
CORR
2008
Springer
13 years 4 months ago
2008
Springer
MICRO
2008
IEEE
13 years 11 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...