38 search results - page 3 / 8 » Characterizing non-deterministic circuit size |
ICCAD
2005
IEEE
14 years 3 months ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
JGT
2007
13 years 6 months ago
2007
A transition system T of an Eulerian graph G is a family of partitions of the edges incident to each vertex of G into transitions i.e. subsets of size two. A circuit decomposition...
DATE
2003
IEEE
13 years 11 months ago
2003
IEEE
We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults...
LICS
1998
IEEE
13 years 10 months ago
1998
IEEE
Hierarchies (Extended Abstract) Jan Johannsen Chris Pollett Department of Mathematics Department of Computer Science University of California, San Diego Boston University La Jolla,...
ISCAS
2007
IEEE
14 years 17 days ago
2007
IEEE
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...