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» ChipViz : Visualizing Memory Chip Test Data
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ISVC
2007
Springer
13 years 11 months ago
ChipViz : Visualizing Memory Chip Test Data
This paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips al...
Amit P. Sawant, Ravi Raina, Christopher G. Healey
ET
2002
72views more  ET 2002»
13 years 4 months ago
Deterministic Test Vector Compression/Decompression for Systems-on-a-Chip Using an Embedded Processor
Abstract. A novel approach for using an embedded processor to aid in deterministic testing of the other components of a system-on-a-chip (SOC) is presented. The tester loads a prog...
Abhijit Jas, Nur A. Touba
EUROPAR
2003
Springer
13 years 10 months ago
Exploiting On-Chip Data Transfers for Improving Performance of Chip-Scale Multiprocessors
As compared to a complex single processor based system, on-chip multiprocessors are less complex, more power efficient, and easier to test and validate. In this work, we focus on a...
Guangyu Chen, Mahmut T. Kandemir, Alok N. Choudhar...
DAC
1999
ACM
13 years 9 months ago
Microprocessor Based Testing for Core-Based System on Chip
The purpose of this paper is to develop a exible design for test methodology for testing a core-based system on chip SOC. The novel feature of the approach is the use an embedde...
Christos A. Papachristou, F. Martin, Mehrdad Noura...
VLSI
2005
Springer
13 years 10 months ago
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Erik Larsson, Stina Edbom