Sciweavers

46 search results - page 10 / 10
» Chroma Key Using a Checker Pattern Background
Sort
View
PR
2006
164views more  PR 2006»
13 years 5 months ago
Locally linear metric adaptation with application to semi-supervised clustering and image retrieval
Many computer vision and pattern recognition algorithms are very sensitive to the choice of an appropriate distance metric. Some recent research sought to address a variant of the...
Hong Chang, Dit-Yan Yeung