18 search results - page 2 / 4 » Coefficient-based parametric faults detection in analog circ... |
DAC
1998
ACM
13 years 9 months ago
1998
ACM
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
ICCBR
2003
Springer
13 years 10 months ago
2003
Springer
Abstract. There have been some Artificial Intelligence applications developed for electronic circuits diagnosis, but much remains to be done in this field, above all in the analo...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
— We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based on an assemblage of learning machines that are trained beforehand to guide us through ...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...