2 search results - page 1 / 1 » Compacting test vector sets via strategic use of implication... |
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
ICCAD
2001
IEEE
14 years 1 months ago
2001
IEEE
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...