7 search results - page 2 / 2 » Comparative approaches to equipment scheduling in high volum... |
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
PIMRC
2010
IEEE
13 years 3 months ago
2010
IEEE
In current cellular networks base stations (BSs) usually perform independent scheduling without coordinating the resource allocation among different cells. This, however, often lea...