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DAC
2003
ACM
14 years 6 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
DEXA
2005
Springer
148views Database» more  DEXA 2005»
13 years 10 months ago
XG: A Data-Driven Computation Grid for Enterprise-Scale Mining
In this paper we introduce a novel architecture for data processing, based on a functional fusion between a data and a computation layer. We show how such an architecture can be le...
Radu Sion, Ramesh Natarajan, Inderpal Narang, Wen-...
ICS
2007
Tsinghua U.
13 years 11 months ago
Sensitivity analysis for automatic parallelization on multi-cores
Sensitivity Analysis (SA) is a novel compiler technique that complements, and integrates with, static automatic parallelization analysis for the cases when relevant program behavi...
Silvius Rus, Maikel Pennings, Lawrence Rauchwerger