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BMVC
1998
13 years 7 months ago
Corner Detection Via Topographic Analysis of Vector Potential
This paper describes how corner detection can be realised using a new feature representation that has recently been successfully exploited for edge and symmetry detection. The fea...
Bin Luo, Andrew D. J. Cross, Edwin R. Hancock
CVPR
2012
IEEE
11 years 8 months ago
Mode-seeking on graphs via random walks
Mode-seeking has been widely used as a powerful data analysis technique for clustering and filtering in a metric feature space. We introduce a versatile and efficient modeseekin...
Minsu Cho, Kyoung Mu Lee
ECCV
2004
Springer
14 years 7 months ago
Multiple View Feature Descriptors from Image Sequences via Kernel Principal Component Analysis
Abstract. We present a method for learning feature descriptors using multiple images, motivated by the problems of mobile robot navigation and localization. The technique uses the ...
Jason Meltzer, Ming-Hsuan Yang, Rakesh Gupta, Stef...
CVPR
2003
IEEE
14 years 7 months ago
Statistics of Shape via Principal Geodesic Analysis on Lie Groups
Principal component analysis has proven to be useful for understanding geometric variability in populations of parameterized objects. The statistical framework is well understood ...
P. Thomas Fletcher, Conglin Lu, Sarang C. Joshi
TIP
2008
128views more  TIP 2008»
13 years 5 months ago
The Pairing of a Wavelet Basis With a Mildly Redundant Analysis via Subband Regression
A distinction is usually made between wavelet bases and wavelet frames. The former are associated with a one-to-one representation of signals, which is somewhat constrained but mos...
Michael Unser, Dimitri Van De Ville