3 search results - page 1 / 1 » Computer-aided fault to defect mapping (CAFDM) for defect di... |
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
DAC
2004
ACM
14 years 6 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...