2 search results - page 1 / 1 » Concurrent Self-Test with Partially Specified Patterns for L... |
ETS
2009
IEEE
13 years 3 months ago
2009
IEEE
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...