238 search results - page 2 / 48 » Conflicts and Fair Testing |
ASWEC
2007
IEEE
13 years 9 months ago
2007
IEEE
Testers often represent systems under test in input parameter models. These contain parameters with associated values. Combinations of parameter values, with one value for each pa...
ICCAD
2002
IEEE
14 years 2 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
DCC
2011
IEEE
13 years 7 days ago
2011
IEEE
FORTE
1996
13 years 6 months ago
1996
In this paper we present the application of the fair testing pre-order, introduced in a previous paper, to the speci cation and analysis of distributed systems. This pre-order com...
AAAI
2006
13 years 6 months ago
2006
We establish a declarative theory of forgetting for disjunctive logic programs. The suitability of this theory is justified by a number of desirable properties. In particular, one...