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INFOCOM
1996
IEEE
13 years 8 months ago
Context Independent Unique Sequences Generation for Protocol Testing
T. Ramalingom, Krishnaiyan Thulasiraman, Anindya D...
DATE
2000
IEEE
121views Hardware» more  DATE 2000»
13 years 9 months ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy
FMICS
2006
Springer
13 years 8 months ago
Model-Based Testing of a WAP Gateway: An Industrial Case-Study
Abstract. We present experiences from a case study where a model-based approach to black-box testing is applied to verify that a Wireless Application Protocol (WAP) gateway conform...
Anders Hessel, Paul Pettersson
BMCBI
2010
132views more  BMCBI 2010»
13 years 4 months ago
Next generation tools for genomic data generation, distribution, and visualization
Background: With the rapidly falling cost and availability of high throughput sequencing and microarray technologies, the bottleneck for effectively using genomic analysis in the ...
David A. Nix, Tonya L. Di Sera, Brian K. Dalley, B...
BMCBI
2007
130views more  BMCBI 2007»
13 years 4 months ago
HMM-ModE - Improved classification using profile hidden Markov models by optimising the discrimination threshold and modifying e
Background: Profile Hidden Markov Models (HMM) are statistical representations of protein families derived from patterns of sequence conservation in multiple alignments and have b...
Prashant K. Srivastava, Dhwani K. Desai, Soumyadee...