74 search results - page 15 / 15 » Controlling Peak Power During Scan Testing |
ACSAC
2008
IEEE
13 years 11 months ago
2008
IEEE
Main memory contains transient information for all resident applications. However, if memory chip contents survives power-off, e.g., via freezing DRAM chips, sensitive data such a...
BMCBI
2006
13 years 5 months ago
2006
Background: High-density microarray technology is increasingly applied to study gene expression levels on a large scale. Microarray experiments rely on several critical steps that...
BMCBI
2005
13 years 4 months ago
2005
Background: Cis-regulatory modules are combinations of regulatory elements occurring in close proximity to each other that control the spatial and temporal expression of genes. Th...
LCTRTS
2000
Springer
13 years 8 months ago
2000
Springer
The control system of many complex mechatronic products requires for each task the Worst Case Execution Time (WCET), which is needed for the scheduler's admission tests and su...