34 search results - page 1 / 7 » Cost Reduction and Evaluation of a Temporary Faults Detectin... |
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
DSN
2005
IEEE
13 years 6 months ago
2005
IEEE
The increasing transient fault rate will necessitate onchip fault tolerance techniques in future processors. The speed gap between the processor and the memory is also increasing,...
SAC
2009
ACM
13 years 11 months ago
2009
ACM
Software developers use testing to gain and maintain confidence in the correctness of a software system. Automated reduction and prioritization techniques attempt to decrease the...
ICSM
2005
IEEE
13 years 10 months ago
2005
IEEE
Automated cost-effective test strategies are needed to provide reliable, secure, and usable web applications. As a software maintainer updates an application, test cases must accu...
DFT
2000
IEEE
13 years 9 months ago
2000
IEEE
1 Over the last years, an increasing number of safety-critical tasks have been demanded to computer systems. In particular, safety-critical computer-based applications are hitting ...