— A radiation hardening technique for combinational logic circuits is described. The key idea is to exploit the asymmetric logical masking probabilities of gates, hardening gates...
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
Oscar Ruano, Pilar Reyes, Juan Antonio Maestro, Lu...
Modern FPGAs have been designed with advanced integrated circuit techniques that allow high speed and low power performance, joined to reconfiguration capabilities. This makes new...
The world is increasingly dependent on critical infrastructures such as the electric power grid, water, gas, and oil transport systems, which are susceptible to cascading failures...
Travis C. Service, Daniel R. Tauritz, William M. S...