3 search results - page 1 / 1 » Critical Charge Characterization for Soft Error Rate Modelin... |
ISCAS
2007
IEEE
13 years 10 months ago
2007
IEEE
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
SIGMETRICS
2011
ACM
12 years 7 months ago
2011
ACM
The amount of charge stored in an SRAM cell shrinks rapidly with each technology generation thus increasingly exposing caches to soft errors. Benchmarking the FIT rate of caches d...