2 search results - page 1 / 1 » Cross-layer resilience using wearout aware design flow |
DSN
2011
IEEE
12 years 4 months ago
2011
IEEE
—As process technology shrinks devices, circuits experience accelerated wearout. Monitoring wearout will be critical for improving the efficiency of error detection and correctio...
INFOCOM
2009
IEEE
13 years 11 months ago
2009
IEEE
—In layered networks, a single failure at a lower layer may cause multiple failures in the upper layers. As a result, traditional schemes that protect against single failures may...