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MR
2002
82views Robotics» more  MR 2002»
13 years 5 months ago
Failure modes of tantalum capacitors made by different technologies
Generally, tantalum capacitor failure modes have been discussed both for the standard manganese dioxide cathode and the new conductive polymer (CP) type. For standard tantalum in ...
Petr Vasina, T. Zednicek, Josef Sikula, Jan Pavelk...
SIGMETRICS
2011
ACM
178views Hardware» more  SIGMETRICS 2011»
12 years 8 months ago
Soft error benchmarking of L2 caches with PARMA
The amount of charge stored in an SRAM cell shrinks rapidly with each technology generation thus increasingly exposing caches to soft errors. Benchmarking the FIT rate of caches d...
Jinho Suh, Mehrtash Manoochehri, Murali Annavaram,...