43 search results - page 9 / 9 » Cycle count accurate memory modeling in system level design |
FAST
2010
13 years 7 months ago
2010
An understanding of application I/O access patterns is useful in several situations. First, gaining insight into what applications are doing with their data at a semantic level he...
ISLPED
2006
ACM
13 years 10 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
DSD
2002
IEEE
13 years 9 months ago
2002
IEEE
Continuing VLSI technology scaling raises several deep submicron (DSM) problems like relatively slow interconnect, power dissipation and distribution, and signal integrity. Those ...