3 search results - page 1 / 1 » Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for ... |
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
- A Cyclic-CPRS (Column Parity Row Selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors....
IOLTS
2006
IEEE
13 years 10 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
This paper presents a design methodology that was applied to the design of a 2.4GHz dual-core SPARC64TM microprocessor with 90nm CMOS technology. It focuses on the newly adopted t...