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VLSID
2004
IEEE
112views VLSI» more  VLSID 2004»
14 years 6 months ago
Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. C...
Sagar S. Sabade, D. M. H. Walker
ICASSP
2011
IEEE
12 years 9 months ago
Tone detection of non-uniformly undersampled signals with frequency excision
We address the problem of detecting and locating narrowband tones in an undersampled signal. It is known that uniformly undersampled signals exhibit frequency aliasing, whereby th...
André Bourdoux, Sofie Pollin, Antoine Dejon...
VLSID
2003
IEEE
104views VLSI» more  VLSID 2003»
14 years 6 months ago
Analyzing Soft Errors in Leakage Optimized SRAM Design
Reducing leakage power and improving the reliability of data stored in the memory cells are both becoming challenging as technology scales down. While the smaller threshold voltag...
Vijay Degalahal, Narayanan Vijaykrishnan, Mary Jan...
ITNG
2006
IEEE
13 years 11 months ago
Side-Channel Leakage Tolerant Architectures
Side-channel attacks compare side-channel leakage predictions or estimations with side-channel leakage measurements. The estimations are based on the exact value of a few select s...
Kris Tiri, Patrick Schaumont, Ingrid Verbauwhede
CODES
2003
IEEE
13 years 11 months ago
Tracking object life cycle for leakage energy optimization
The focus of this work is on utilizing the state of objects during their lifespan in optimizing the leakage energy consumed in the data caches when executing embedded Java applica...
Guangyu Chen, Narayanan Vijaykrishnan, Mahmut T. K...