11 search results - page 1 / 3 » Defect tolerant probabilistic design paradigm for nanotechno... |
DAC
2004
ACM
14 years 5 months ago
2004
ACM
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the trem...
ISVLSI
2006
IEEE
13 years 10 months ago
2006
IEEE
With advances in process technology, the feature sizes are decreasing, which leads to higher defect densities. More sophisticated techniques, at increased costs are required to av...
VLSID
2004
IEEE
14 years 4 months ago
2004
IEEE
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...
DAC
2005
ACM
14 years 5 months ago
2005
ACM
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
DAC
2005
ACM
14 years 5 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...