12 search results - page 3 / 3 » Deformation-Aware Log-Linear Models |
ICDM
2006
IEEE
13 years 11 months ago
2006
IEEE
— Log-linear models are widely used for labeling feature vectors and graphical models, typically to estimate robust conditional distributions in presence of a large number of pot...
EMNLP
2009
13 years 3 months ago
2009
This paper shows that discriminative reranking with an averaged perceptron model yields substantial improvements in realization quality with CCG. The paper confirms the utility of...