2 search results - page 1 / 1 » Delay Fault Localization in Test-Per-Scan BIST Using Built-I... |
IOLTS
2006
IEEE
13 years 10 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
UIC
2007
Springer
13 years 10 months ago
2007
Springer
Abstract. Sensor relocation protocols can be employed as fault tolerance approach to offset the coverage loss caused by node failures. We introduce a novel localized structure, in...