31 search results - page 1 / 7 » Delay Test Quality Evaluation Using Bounded Gate Delays |
VTS
2007
IEEE
13 years 10 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
DATE
2003
IEEE
13 years 9 months ago
2003
IEEE
The growing impact of within-die process variation has created the need for statistical timing analysis, where gate delays are modeled as random variables. Statistical timing anal...
MM
2004
ACM
13 years 10 months ago
2004
ACM
Carriers increasingly differentiate their wide-area connectivity offerings by means of customized services, such as virtual private networks (VPN) with Quality of Service (QoS) g...
ATS
2000
IEEE
13 years 9 months ago
2000
IEEE
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
In this paper, we propose a new sensitivity based, statistical gate sizing method. Since circuit optimization effects the entire shape of the circuit delay distribution, it is dif...