3 search results - page 1 / 1 » Design for testability using register-transfer level partial... |
ASPDAC
1995
ACM
13 years 7 months ago
1995
ACM
Abstract - An approach to top down design for testability using register-transfer level(RTL) partial scan selection is described. We propose a scan selection technique based on tes...
DAC
1994
ACM
13 years 8 months ago
1994
ACM
This paper introduces hot potato high level synthesis transformation techniques. These techniques add deflection operations in a computation in such a way that a specific goal is ...
ICCAD
1996
IEEE
13 years 8 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...