33 search results - page 6 / 7 » Design of Testable Random Bit Generators |
ATS
2000
IEEE
13 years 9 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
ICASSP
2008
IEEE
13 years 11 months ago
2008
IEEE
Distributed coding of correlated grayscale stereo images is effectively addressed by a recently proposed codec that learns block-wise disparity at the decoder. Based on the Slepia...
ITNG
2007
IEEE
13 years 11 months ago
2007
IEEE
In wireless sensor networks, the data transmitted from the sensor nodes are vulnerable to corruption by errors induced by noisy channels and other factors. Hence it is necessary t...
ECCC
2010
13 years 4 months ago
2010
We study a variant of the classical circuit-lower-bound problems: proving lower bounds for sampling distributions given random bits. We prove a lower bound of 1 - 1/n(1) on the st...
JOC
2008
13 years 4 months ago
2008
In this paper, we study an E0-like combiner with memory as the keystream generator. First, we formulate a systematic and simple method to compute correlations of the FSM output seq...