— This paper presents a novel design of analog window comparator circuit. The comparator can adaptively adjust its error threshold according to the magnitude of input signal leve...
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...
Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. ...
We present a new approach for dealing with distribution change and concept drift when learning from data sequences that may vary with time. We use sliding windows whose size, inst...
This paper presents a robust adaptive goodness-of-fit (GOF) χ2 test event detector for non-intrusive load monitoring applications. We derive a closed form for the decision thres...
Yuanwei Jin, Eniye Tebekaemi, Mario Berges, Lucio ...