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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
14 years 5 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
KBSE
2005
IEEE
13 years 10 months ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...
DRM
2003
Springer
13 years 10 months ago
Constructing a virtual primary key for fingerprinting relational data
Agrawal and Kiernan’s watermarking technique for database relations [1] and Li et al’s fingerprinting extension [6] both depend critically on primary key attributes. Hence, t...
Yingjiu Li, Vipin Swarup, Sushil Jajodia
CSDA
2007
136views more  CSDA 2007»
13 years 4 months ago
A note on iterative marginal optimization: a simple algorithm for maximum rank correlation estimation
The maximum rank correlation (MRC) estimator was originally studied by Han [1987. Nonparametric analysis of a generalized regression model. J. Econometrics 35, 303–316] and Sher...
Hansheng Wang
BMCBI
2005
121views more  BMCBI 2005»
13 years 4 months ago
Comparison of seven methods for producing Affymetrix expression scores based on False Discovery Rates in disease profiling data
Background: A critical step in processing oligonucleotide microarray data is combining the information in multiple probes to produce a single number that best captures the express...
Kerby Shedden, Wei Chen, Rork Kuick, Debashis Ghos...