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ETS
2011
IEEE
230views Hardware» more  ETS 2011»
12 years 5 months ago
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak,...
TSE
2002
140views more  TSE 2002»
13 years 4 months ago
Test Case Prioritization: A Family of Empirical Studies
To reduce the cost of regression testing, software testers may prioritize their test cases so that those which are more important, by some measure, are run earlier in the regressi...
Sebastian G. Elbaum, Alexey G. Malishevsky, Gregg ...
ICPR
2004
IEEE
14 years 6 months ago
Robust Modelling of Local Image Structures and Its Application to Medical Imagery
A robust modelling method for detecting and measuring isotropic, linear features and bifurcations is described and applied to analysing 2d eletrophoresis and retinal images. Featu...
Li Wang, Abhir Bhalerao, Roland Wilson
BMCBI
2010
151views more  BMCBI 2010»
13 years 5 months ago
Classification of G-protein coupled receptors based on support vector machine with maximum relevance minimum redundancy and gene
Background: Because a priori knowledge about function of G protein-coupled receptors (GPCRs) can provide useful information to pharmaceutical research, the determination of their ...
Zhanchao Li, Xuan Zhou, Zong Dai, Xiaoyong Zou
TOOLS
2008
IEEE
13 years 11 months ago
Towards Raising the Failure of Unit Tests to the Level of Compiler-Reported Errors
Running unit tests suites with contemporary tools such as JUNIT can show the presence of bugs, but not their locations. This is different from checking a program with a compiler, w...
Friedrich Steimann, Thomas Eichstädt-Engelen,...