8 search results - page 2 / 2 » Detection of CMOS Defects under Variable Processing Conditio... |
CCECE
2006
IEEE
13 years 11 months ago
2006
IEEE
Software inspection is a method to detect errors in software artefacts early in the development cycle. At the end of the inspection process the inspectors need to make a decision ...
SMC
2007
IEEE
13 years 11 months ago
2007
IEEE
—In real world machine vision problems, numerous issues such as variable scene illumination make edge and object detection difficult. There exists no universal edge detection met...
ICASSP
2009
IEEE
14 years 21 hour ago
2009
IEEE
This paper presents a new method for analysis of center of pressure (COP) signals using Empirical Mode Decomposition (EMD). The EMD decomposes a COP signal into a finite set of b...