29 search results - page 2 / 6 » Digital Integrated Circuit Testing using Transient Signal An... |
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ICTAI
2002
IEEE
13 years 10 months ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
DAC
2004
ACM
14 years 6 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
ICCAD
2008
IEEE
14 years 2 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper presents a time-domain jitter expansion technique for high-speed digital bit sequence jitter testing. While jitter expansion has been applied to phase noise measurement...