29 search results - page 5 / 6 » Digital Integrated Circuit Testing using Transient Signal An... |
ICCAD
1998
IEEE
13 years 10 months ago
1998
IEEE
Noise can cause digital circuits to switch incorrectly and thus produce spurious results. Noise can also have adverse power, timing and reliability e ects. Dynamic logic is partic...
CODES
2011
IEEE
12 years 6 months ago
2011
IEEE
Reliability is a major requirement for most safety-related systems. To meet this requirement, fault-tolerant techniques such as hardware replication and software re-execution are ...
FPGA
2010
ACM
13 years 4 months ago
2010
ACM
Metastability is a phenomenon that can cause system failures in digital circuits. It may occur whenever signals are being transmitted across asynchronous or unrelated clock domain...
RSP
2003
IEEE
13 years 11 months ago
2003
IEEE
This paper describes the early analysis and estimation features currently implemented in the Berkeley Emulation Engine (BEE) system. BEE is an integrated rapid prototyping and des...
DELTA
2006
IEEE
14 years 5 days ago
2006
IEEE
In high speed digital circuits, the inductive effect is more dominant compared to capacitive effect. In particular, as the technology is shrinking, the spacing between interconnec...