8 search results - page 1 / 2 » Divide-and-Conquer IDDQ Testing for Core-Based System Chips |
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
ET
2002
13 years 4 months ago
2002
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
DAC
1999
ACM
13 years 8 months ago
1999
ACM
The purpose of this paper is to develop a exible design for test methodology for testing a core-based system on chip SOC . The novel feature of the approach is the use an embedde...
DFT
1997
IEEE
13 years 8 months ago
1997
IEEE
Abstract— Error control is a major concern in many computer systems, particularly those deployed in critical applications. Experience shows that most malfunctions during system o...