10 search results - page 1 / 2 » Dynamic Fault Diagnosis of Combinational and Sequential Circ... |
ET
2007
13 years 4 months ago
2007
This article describes an emulation-based method for locating stuck-at faults in combinational and synchronous sequential circuits. The method is based on automatically designing a...
ASPDAC
2006
ACM
13 years 10 months ago
2006
ACM
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
DFT
2003
IEEE
13 years 9 months ago
2003
IEEE
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...
ICCAD
1997
IEEE
13 years 8 months ago
1997
IEEE
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is applicable to combinational ...
ICCAD
1998
IEEE
13 years 8 months ago
1998
IEEE
We present a fast, dynamic fault coverage estimation technique for sequential circuits that achieves high degrees of accuracy by signi cantly reducing the number of injected fault...