5 search results - page 1 / 1 » Dynamic test selection for reconfigurable diagnosis |
CDC
2008
IEEE
13 years 6 months ago
2008
IEEE
Abstract-- Detecting and isolating multiple faults is a computationally intense task which typically consists of computing a set of tests, and then computing the diagnoses based on...
CSREAESA
2006
13 years 6 months ago
2006
Abstract
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
IJCAI
2003
13 years 6 months ago
2003
We address the task of problem determination in a distributed system using probes, or test transactions, which gather information about system components. Effective probing requir...
HPCA
2006
IEEE
14 years 5 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...