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DATE
1999
IEEE
147views Hardware» more  DATE 1999»
10 years 7 months ago
Efficient BIST Hardware Insertion with Low Test Application Time for Synthesized Data Paths
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
Nicola Nicolici, Bashir M. Al-Hashimi
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
11 years 3 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
ITC
1996
IEEE
107views Hardware» more  ITC 1996»
10 years 6 months ago
Orthogonal Scan: Low-Overhead Scan for Data Paths
Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
Robert B. Norwood, Edward J. McCluskey
ITC
2003
IEEE
205views Hardware» more  ITC 2003»
10 years 8 months ago
H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Ki...
DSD
2005
IEEE
116views Hardware» more  DSD 2005»
10 years 8 months ago
Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
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