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HPCA
2008
IEEE
14 years 5 months ago
Supporting highly-decoupled thread-level redundancy for parallel programs
The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can p...
M. Wasiur Rashid, Michael C. Huang
APCSAC
2000
IEEE
13 years 9 months ago
Micro-Threading: A New Approach to Future RISC
This paper briefly reviews the current research into RISC microprocessor architecture, which now seems to be so complex as to make the acronym somewhat of an oxymoron. In response...
Chris R. Jesshope, Bing Luo