49 search results - page 1 / 10 » Efficient Space Time Compression to Reduce Test Data Volume ... |
VLSID
2005
IEEE
14 years 4 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
TVLSI
2008
13 years 4 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
DATE
2008
IEEE
2008
IEEE
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
13 years 6 months ago
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...