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DAC
2008
ACM
14 years 6 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
MM
2004
ACM
99views Multimedia» more  MM 2004»
13 years 10 months ago
Locality preserving clustering for image database
It is important and challenging to make the growing image repositories easy to search and browse. Image clustering is a technique that helps in several ways, including image data ...
Xin Zheng, Deng Cai, Xiaofei He, Wei-Ying Ma, Xuey...
BMCBI
2010
157views more  BMCBI 2010»
13 years 5 months ago
SeqTrim: a high-throughput pipeline for pre-processing any type of sequence read
Background: High-throughput automated sequencing has enabled an exponential growth rate of sequencing data. This requires increasing sequence quality and reliability in order to a...
Juan Falgueras, Antonio J. Lara, Noé Fern&a...