2 search results - page 1 / 1 » Elliptic Curve Cryptosystems in the Presence of Permanent an... |
DCC
2005
IEEE
14 years 4 months ago
2005
IEEE
Elliptic curve cryptosystems in the presence of faults were studied by Biehl, Meyer and M?uller (2000). The first fault model they consider requires that the input point P in the c...
HPCA
2006
IEEE
14 years 5 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...