3 search results - page 1 / 1 » Embedded Self Repair by Transistor and Gate Level Reconfigur... |
DDECS
2006
IEEE
13 years 9 months ago
2006
IEEE
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
In modern SoCs, embedded memories occupy the largest part of the chip area and include an even larger amount of active devices. As memories are designed very tightly to the limits...
CSREAESA
2009
13 years 6 months ago
2009
A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...