68 search results - page 14 / 14 » Evaluation of voltage interpolation to address process varia... |
HPCA
2006
IEEE
14 years 6 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
ECCV
2010
Springer
13 years 10 months ago
2010
Springer
Computational depth estimation is a central task in computer vision and graphics. A large variety of strategies have been introduced in the past relying on viewpoint variations, de...
IJMMS
2008
13 years 5 months ago
2008
Drivers need assistance when navigating an unfamiliar route. In-vehicle navigation systems have improved in recent years due to the technology advances, but are sometimes problema...