7 search results - page 1 / 2 » Experimental Results for IDDQ and VLV Testing |
VTS
1998
IEEE
13 years 9 months ago
1998
IEEE
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
A tunneling-open failure mode is proposed and carefully studied. A circuit with a tunneling open could pass at-speed Boolean tests but fail VLV testing or IDDQ testing. Theoretica...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
ITC
1995
IEEE
13 years 8 months ago
1995
IEEE
This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and tes...