2 search results - page 1 / 1 » Exploiting Logic Simulation to Improve Simulation-based Sequ... |
ATS
1997
IEEE
13 years 10 months ago
1997
IEEE
MTV
2007
IEEE
14 years 21 hour ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...