18 search results - page 1 / 4 » Exploiting Structural Duplication for Lifetime Reliability E... |
ISCA
2005
IEEE
13 years 10 months ago
2005
IEEE
Increased power densities (and resultant temperatures) and other effects of device scaling are predicted to cause significant lifetime reliability problems in the near future. In...
HIPEAC
2010
Springer
14 years 1 months ago
2010
Springer
As CMOS feature sizes venture deep into the nanometer regime, wearout mechanisms including negative-bias temperature instability and timedependent dielectric breakdown can severely...
DSN
2009
IEEE
2009
IEEE
Processor reliability enhancement through compiler-directed register file peak temperature reduction
13 years 8 months ago
Each semiconductor technology generation brings us closer to the imminent processor architecture heat wall, with all its associated adverse effects on system performance and reliab...
INFOCOM
2005
IEEE
13 years 10 months ago
2005
IEEE
—The presence of heterogeneous nodes (i.e., nodes with an enhanced energy capacity or communication capability) in a sensor network is known to increase network reliability and l...
DAC
2008
ACM
13 years 6 months ago
2008
ACM
Battery lifetime and safety are primary concerns in the design of battery operated systems. Lifetime management is typically supervised by the system via battery-aware task schedu...