4 search results - page 1 / 1 » Extending the TokenCMP Cache Coherence Protocol for Low Over... |
TPDS
2008
13 years 4 months ago
2008
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On th...
HPCA
2007
IEEE
14 years 4 months ago
2007
IEEE
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On t...
DSD
2008
IEEE
13 years 6 months ago
2008
IEEE
Due to modern technology trends such as decreasing feature sizes and lower voltage levels, fault tolerance is becoming increasingly important in computing systems. Shared memory i...
DAC
2011
ACM
12 years 4 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...