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    DATE
    2006
    IEEE
    111views Hardware» more  DATE 2006»
    Extraction of defect density and size distributions from wafer sort test results
    13 years 11 months ago
    Extraction of defect density and size distributions from wafer sort test results
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    Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
    Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jas...
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    MSR
    2006
    ACM
    139views Software Engineering» more  MSR 2006»
    Predicting defect densities in source code files with decision tree learners
    13 years 11 months ago
    Predicting defect densities in source code files with decision tree learners
    Download  swerl.tudelft.nl
    With the advent of open source software repositories the data available for defect prediction in source files increased tremendously. Although traditional statistics turned out t...
    Patrick Knab, Martin Pinzger, Abraham Bernstein
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